| [1] | Kobayashi S,Yamamoto Y,Ito M et al.IEEE J Q E,1982;18(4):582 |
| [2] | Yonemura M.O pt Lett,1985;10(1):1 |
| [3] | Beheim G,Fritsch K.Electron Lett,1985;21(3):93 |
| [1] | Kobayashi S,Yamamoto Y,Ito M et al.IEEE J Q E,1982;18(4):582 |
| [2] | Yonemura M.O pt Lett,1985;10(1):1 |
| [3] | Beheim G,Fritsch K.Electron Lett,1985;21(3):93 |