缺陷层厚度对1维光子晶体孪生缺陷模的影响

王吉科; 夏海燕; 闫珂柱; 姜迎迎

doi:10.3969/j.issn.1001-3806.2009.04.020

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缺陷层厚度对1维光子晶体孪生缺陷模的影响

王吉科 , 夏海燕 , 闫珂柱 , 姜迎迎

文章导航 > 激光技术 > 2009 > 33(4): 403-405,412

引用本文:

Citation:

缺陷层厚度对1维光子晶体孪生缺陷模的影响

1.
曲阜师范大学, 物理工程学院, 曲阜, 273165;
2.
济宁学院, 物理系, 曲阜, 273155

作者简介: 王吉科(1981- ),男,硕士研究生,主要从事1维光子晶体理论方面的研究..

通讯作者: 王吉科, yankezhu@126.com ;

中图分类号: O436

Effect of thickness of defect layer on dual defect modes of 1-D photonic crystal

1.
College of Physics and Engineering, Qufu Normal University, Qufu 273165, China;
2.
Department of Physics, Jining University, Qufu 273155, China

Corresponding author: WANG Ji-ke, yankezhu@126.com ;

CLC number: O436

摘要: 为了研究由1维特定掺杂光子晶体生成的孪生缺陷模与缺陷层厚度的关系,采用特征矩阵的方法进行了理论分析。结果表明,当整体改变这种缺陷层厚度时,孪生缺陷模低频和高频模位置的变化情况各不相同;当仅改变缺陷层的正折射率材料的厚度时,随着厚度增加,孪生缺陷模红移;当仅改变缺陷层负折射率材料的厚度时,随着厚度增加,缺陷模蓝移;并且孪生缺陷模透射率的变化也很复杂。这一结果为设计有特殊用途的光子晶体器件提供了理论依据。
- 物理光学 /
- 光子晶体 /
- 特征矩阵 /
- 孪生缺陷模
Abstract: With the eigen matrix method,it analysed the relation between dual defect modes and the thickness of the defect layer in 1-D photonic crystal was analyzed. The results showed that when the thickness of the defect layer was changed totally,the position of dual defect modes at low frequencies was different from that at high frequencies. When the thickness of the material with positive refractive index was solely increased,the position of dual defect layers was red-shifted. On the contrary,the position was blue-shifted when the thickness of the material with positive reflective index was solely increased. The transmissivity of dual defect modes changed intricately. The property can be used to design some specific photonic devices.
- physical optics /
- photonic crystal /
- eigen matrix /
- dual defect mode

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缺陷层厚度对1维光子晶体孪生缺陷模的影响

通讯作者: 王吉科, yankezhu@126.com;

作者简介: 王吉科(1981- ),男,硕士研究生,主要从事1维光子晶体理论方面的研究.

1. 曲阜师范大学, 物理工程学院, 曲阜, 273165;
2. 济宁学院, 物理系, 曲阜, 273155

收稿日期: 2008-05-05
录用日期: 2008-07-04
网络出版日期: 2009-08-25

关键词:

摘要: 为了研究由1维特定掺杂光子晶体生成的孪生缺陷模与缺陷层厚度的关系,采用特征矩阵的方法进行了理论分析。结果表明,当整体改变这种缺陷层厚度时,孪生缺陷模低频和高频模位置的变化情况各不相同;当仅改变缺陷层的正折射率材料的厚度时,随着厚度增加,孪生缺陷模红移;当仅改变缺陷层负折射率材料的厚度时,随着厚度增加,缺陷模蓝移;并且孪生缺陷模透射率的变化也很复杂。这一结果为设计有特殊用途的光子晶体器件提供了理论依据。