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Volume 13 Issue 3
Sep.  2013
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Citation:
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Mapping phase objects using moire def lectometry

  • 1.

    Department of Applied Physics, East China Institute of Technology

  • Received Date: 1988-10-17
  • This paper gives the basic principle of the moire deflectometry for mapping phase objects, discusses the sensitivity of this method, presents a simple and effective method for eliminating the imperfection of optical elements and show some experimental results.
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  • [1]

    Opt,Lett,1980,Vol.5,No.2,P.555.
    [2]

    Opt,Engng,1985,Vol.24,No.6,P.944.
    [3]

    Appl,Opt.,1984,Vol.23,No.14,P.2241.
    [4]

    AIAAJ.,1982,Vol.20,No.4,P.820,
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  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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Mapping phase objects using moire def lectometry

  • 1. Department of Applied Physics, East China Institute of Technology
  • Received Date: 1988-10-17
  • Available Online: 1989-05-25

Abstract: This paper gives the basic principle of the moire deflectometry for mapping phase objects, discusses the sensitivity of this method, presents a simple and effective method for eliminating the imperfection of optical elements and show some experimental results.

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