Advanced Search

ISSN 1001-3806 CN 51-1125/TN Map

Volume 13 Issue 4
Sep.  2013
Article Contents
Turn off MathJax
Article Navigation >  LASER TECHNOLOGY  > 1989 >  13(4): 18-20

Citation:
shu

Orientation determination methods for frequency doubled devices

  • 1.

    Fujian Institute of Material Structure, Academia Sinica

  • Received Date: 1989-04-03
  • The difficulty in the determination of the orientation in frequency doubled devices by X—ray technique has been solved by using the polarization microscope,Thus,the determination of the orientation of sheet crystals can be satisfactorily settled by the combination of these two methods.
  • 加载中
  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索
Get Citation
PDF
XML

Article views(2519) PDF downloads(295) Cited by()

Proportional views

Orientation determination methods for frequency doubled devices

  • 1. Fujian Institute of Material Structure, Academia Sinica
  • Received Date: 1989-04-03
  • Available Online: 1989-07-25

Abstract: The difficulty in the determination of the orientation in frequency doubled devices by X—ray technique has been solved by using the polarization microscope,Thus,the determination of the orientation of sheet crystals can be satisfactorily settled by the combination of these two methods.

    HTML

Catalog

    Copyright © Laser Technology. 蜀ICP备10038222号-1

    Address：No. 7, Section 4, Renmin South Road, Chengdu, Sichuan Province, China Postal Code：610041  Telephone：028-68011091/68011046  Email： jgjs@vip.163.com,  jgjs@sina.com

    Supported by: Beijing Renhe Information Technology Co. Ltd  support: info@rhhz.net

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return