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Volume 29 Issue 1
Sep.  2013
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The progress of extracting phase information based on spatial carrier fringe pattern analysis

  • Several methods for extracting phase information based on spatial carrier fringe pattern are introduced,including sinusoid fitting method,convolution algorithm,Fourier transform method and wavelet transform method.In addition,comprehensive comparison between these methods is made.The fundamental limitations that lower the accuracy of Fourier transform method are examined,and improving approaches are discussed correspondingly.
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  • [1]

    VILLA J, GÓMEZ-PEDERO J A, QUIROGA J A. Sinusoidal leastsquares fitting for temporal fringe pattern analysis [J]. J Modern Opt,2002,49 (13):2257~2266.
    [2]

    GROOT P D. Phase-shift calibration errors in interferometers with spherical Fizeau cavities [J]. Appl Opt, 1995,34 (16):2856~2863.
    [3]

    JÓŸWICKI R, KUJAWINSKA M,SABUT L. New contra old wavefront measurement concepts for interferometric optical testing [J]. Opt Engng,1992,31 (3):422~433.
    [4]

    TAKEDA M. Spatial carrier heterodyne techniques for precision interferometry and profilometry: an overview [J]. SPIE, 1989,1121: 73~88.
    [5]

    SIRKIS J S,CHEN Y M,SINGH H et al. Computerized optical fringe pattern analysis in photomechanics: a review [J]. Opt Engng, 1992,31(2):304~314.
    [6]

    TOYOOKA S,TOMINAGA M. Spatial fringe scanning for optical phase measurement [J]. Opt Commun, 1984,51 (2):68~70.
    [7]

    TOYOOKA S, IWAASA Y. Automatic profilometry of 3-D diffuse objects by spatial phase detection [J]. Appl Opt, 1986,25 (10): 1630~1633.
    [8]

    RANSOM P L, KOKAL J V. Interferogram analysis by a modified sinusoid fitting technique [J]. Appl Opt,1986,25(22):4199~4204.
    [9]

    WOMACK K H. Interferometric phase measurement using spatial synchronous detection [J]. Opt Engng,1984,23(4):391~395.
    [10]

    TANG S, HUNG Y. Fast profilometer for the automatic measurement of 3-D object shapes [J]. Appl Opt,1990,29(20):3012~3018.
    [11] 周绍祥,高瞻,胡玉禧.光载波条纹图的计算机辅助分析——阶梯形虚拟光栅解调法[J].光子学报,1998,27(3):228~233.

    [12]

    TAKEDA M, INA H, KOBAYASHI S. Fouier-transform method of fringe-pattern analysis for computer-based topography and interferometry [J].J O S A,1982,72(1):156~160.
    [13] 姚卫,李振华,贺安之.用伽伯小波作干涉波前重建[J].光学学报,1999,19(6):805~810.

    [14]

    WATKINS L R,TAN S M, BARNES T H. Determination of interferometer phase distributions by use of wavelets [J]. Opt Lett, 1999,24(13):905~907.
    [15] 顾杰,陈方.光载波条纹自动化图像处理[J].中国激光,1994,21(6):499~503.

    [16]

    GU J,CHEN F. Fast Fourier transform,iteration,and least-squares-fit demodulation image processing for analysis of single-carrier fringe pattern [J]. J O S A, 1995,12(10):2159~2164.
    [17]

    FERNANDEZ A,KAUFMANN G H, BLANCO-GARCIA J et al. Fast Fourier transform,iteration, and least-squares-fit demodulation image processing for analysis of single-carrier fringe pattern [J]. Opt Engng, 1998,37 (11):2899~2905.
    [18]

    BONE D J, BACHOR H A, SANDEMAN R J. Fringe-pattern analysis using a 2-D Fourier transform [J]. Appl Opt, 1986,25 (10): 1653~1660.
    [19]

    BRACEWELL R N. Aspects of the Hartley transform [J]. Proc IEEE,1994,82(3):381~386.
    [20]

    NG T W. Speckle photography fringe analysis using the discrete Hartley transform [J]. Opt Commun,1997,136(1):11~15.
    [21]

    MASSIG J H,HEPPNER J. Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests [J]. Appl Opt,2001,40(13):2081~2088.
    [22]

    RODDIER C, RODDIER F. Interferogram analysis using Fourier transform techniques [J]. Appl Opt, 1987,26(9):1668~1673.
    [23]

    GE Z, KOBAYASHI F, MATSUDA S et al. Coordinate-transform technique for closed-fringe analysis by the Fourier-transform method [J]. Appl Opt,2001,40(10):1649~1657.
    [24]

    LIU J B, RONNEY P D. Modified Fourier transform method for interferogram fringe pattern analysis [J]. Appl Opt,1997,36(25):6231~6241.
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The progress of extracting phase information based on spatial carrier fringe pattern analysis

    Corresponding author: lvzw@hit.edu.cn
  • 1. Institute of Opto-electronics, Harbin Institute of Technology, Harbin 150001, China

Abstract: Several methods for extracting phase information based on spatial carrier fringe pattern are introduced,including sinusoid fitting method,convolution algorithm,Fourier transform method and wavelet transform method.In addition,comprehensive comparison between these methods is made.The fundamental limitations that lower the accuracy of Fourier transform method are examined,and improving approaches are discussed correspondingly.

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