Design of driving circuits of semiconductor lasers for measurement of continuous-wave cavity ring-down technology
-
1.
College of Photoelectric Science and Engineering, National University of Defense Technology, Changsha 410073, China
-
Corresponding author:
LONG Xing-wu, xwlong110@sina.com
-
Received Date:
2006-11-17
Accepted Date:
2006-12-20
-
Abstract
In order to apply semiconductor laser to measure cavity loss with continuous-wave cavity ring-down technology,the laser diode's driving circuit was designed.The circuit was composed of different modules,such as modulation,driver and temperature controller.Based on theory of passive cavity's multi-beam interference,modules' parameter demand was suggested after analysis and numerical simulation of ring-down signal.The measurement system of cavity loss was built with the circuit.Under the guarantee of the semiconductor laser trouble-free,tests indicated that the shutoff time of laser diode was about 60ns and the precision of temperature controller was better than 0.01℃.The measuring accuracy was better than 1% for a cavity whose single pass loss is about 50×10-6.Results indicate that the circuit meet the theory design demands and can be applied in high-accuracy measurement of cavity loss.
-
-
References
|
[1]
|
ANDERSON D Z,FRISCH J C,MASSER C S.Mirror reflectometer based on optical cavity decay time[J].Appl Opt,1984,23(8):1238-1245. |
|
[2]
|
O'KEEFE A,DEACON D A G.Cavity ring-down optical spectrometer for absorption measurements using pulsed laser sources[J].Review of Science Instrum,1988,59(12):2544-2551. |
|
[3]
|
BERDEN G,PEETERS R,MEIJER G.Cavity ring-down spectrosco-py:experimental schemes and applications[J].International Reviews in Physical Chemistry,2000,19(4):565-607. |
|
[4]
|
LIANG Y H.Mirror reflectometer of very high reflectivity[D].Changsha:Postgraduate Academic of National University of Defense Technology,2000:47-50(in Chinese). |
|
[5]
|
SUN F G,DAI D W,XIE J Ch,et al.Accurate reflectivity measurement of high reflective mirrors via a cavity ring-down method[J].Chinese Journal of Lasers,1999,A26(1):35-38(in Chinese). |
|
[6]
|
YI H Y,PENG Y,TIAN X Q,et al.Experimental study on reflectivity measurement of single wavelength by cavity ring-down method[J].Laser Technology,2005,29(4):337-339(in Chinese). |
|
[7]
|
FU Y J,ZOU W D,XIAO H R,et al.Optic power control of LD drive circuit[J].Infrared and Laser Engineering,2005,34(5):626-630(in Chinese). |
|
[8]
|
SUN X M.Theory and application of semiconductor laser's interference[M].Beijing:National Defence Industry Press,2001:25-28(in Chinese). |
|
[9]
|
HE G Y.Usual numerical value arithmetic volume of visual C++[M].Beijing:Science Press,2002:466-517(in Chinese). |
-
-
Proportional views
-
Map
DownLoad: