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Volume 15 Issue 1
Sep.  2013
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Citation:
shu

Measurement of gain curves of semiconductor lsaer amplifiers

  • 1.

    Optoelectronics Department of Science and Technology, Sichuan University

  • Received Date: 1990-05-10
  • The gain spectra of the diode laser with antireflective coatings on its facets has been measured under the condition of biassing higher than its threshold. The experimental results agree with the theoretical predictions.
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  • [1] 李大义,卢玉村,陈建国et al,真空科学和技术,1989;9:150
    [2]

    Hakki B W, Paoli T L, J.A.P.,1973;44; 4113
    [3]

    Kaminow I P, Eisenstein C, stulz L W, IEEE J.Q.E.,1983;QE-19;483
    [4]

    Kressel H, Butler J K, Semiconductor Laser and Heterojunction LEDs, New York; Academic Press, 1977; 60
    [5]

    S tern F, J, A. P,1976;47:5328
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  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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Measurement of gain curves of semiconductor lsaer amplifiers

  • 1. Optoelectronics Department of Science and Technology, Sichuan University
  • Received Date: 1990-05-10
  • Available Online: 1991-01-25

Abstract: The gain spectra of the diode laser with antireflective coatings on its facets has been measured under the condition of biassing higher than its threshold. The experimental results agree with the theoretical predictions.

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